Invention Application
- Patent Title: METHOD OF FORMING TRANSITION METAL DICHALCOGENIDE THIN FILM
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Application No.: US18063909Application Date: 2022-12-09
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Publication No.: US20230114347A1Publication Date: 2023-04-13
- Inventor: Changhyun KIM , Sang-Woo Kim , Kyung-Eun BYUN , Hyeonjin SHIN , Ahrum SOHN , Jaehwan JUNG
- Applicant: Samsung Electronics Co., Ltd. , RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Applicant Address: KR Suwon-si; KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee Address: KR Suwon-si; KR Gyeonggi-do
- Priority: KR10-2019-0095165 20190805
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
Disclosed herein are a method of forming a transition metal dichalcogenide thin film and a method of manufacturing a device including the same. The method of forming a transition metal dichalcogenide thin film includes: providing a substrate in a reaction chamber; depositing a transition metal dichalcogenide thin film on the substrate using a sputtering process that uses a transition metal precursor and a chalcogen precursor and is performed at a first temperature; and injecting the chalcogen precursor in a gas state and heat-treating the transition metal dichalcogenide thin film at a second temperature that is higher than the first temperature. The substrate may include a sapphire substrate, a silicon oxide (SiO2) substrate, a nanocrystalline graphene substrate, or a molybdenum disulfide (MoS2) substrate.
Public/Granted literature
- US11869768B2 Method of forming transition metal dichalcogenide thin film Public/Granted day:2024-01-09
Information query
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