Invention Application
- Patent Title: Method for Measuring Distance To A Short In A Two-Conductor Wire
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Application No.: US17451150Application Date: 2021-10-15
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Publication No.: US20230118013A1Publication Date: 2023-04-20
- Inventor: Paul Dominic HISCOCK , Murray JARVIS , Nicolas GRAUBE , Mafalda Pereira VARELA , Thomas ALLAN
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G01R19/165 ; G01S13/88

Abstract:
Various embodiments may provide systems and methods for determining a distance to a short in a two-conductor wire. Various embodiments may include determining a distance to a short in a two-conductor wire based at least in part on a phase difference between a phase of an injected tone and a phase of a reflected tone. Various embodiments may include determining a distance to a short in a two-conductor wire based at least in part on both a phase difference and an amplitude difference between an injected tone and a reflected tone. Various embodiments may include determining a distance to a short in a two-conductor wire based at least in part on a measured peak voltage of a combined pulse.
Public/Granted literature
- US11971441B2 Method for measuring distance to a short in a two-conductor wire Public/Granted day:2024-04-30
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