Invention Application
- Patent Title: Method and apparatus for electric field measurement based on a levitated particle
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Application No.: US18089210Application Date: 2022-12-27
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Publication No.: US20230135076A1Publication Date: 2023-05-04
- Inventor: Huizhu Hu , Zhenhai Fu , Xiaowen Gao , Tao Liang , Peitong He , Jing Jiang
- Applicant: Zhejiang Lab , Zhejiang University
- Applicant Address: CN Hangzhou; CN Hangzhou
- Assignee: Zhejiang Lab,Zhejiang University
- Current Assignee: Zhejiang Lab,Zhejiang University
- Current Assignee Address: CN Hangzhou; CN Hangzhou
- Priority: CN202210336005.6 20220401
- Main IPC: G01R29/12
- IPC: G01R29/12

Abstract:
A method for electric field measurement based on a levitated particle includes steps of (1) capturing a particle and levitating the captured particle; (2) adjusting a quantity of electric charge carried by the levitated particle; (3) measuring a charge number N of the levitated particle; (4) disposing the levitated particle in an electric field to be measured, measuring a displacement power spectral density Svxel of the levitated particle under the electric field and obtaining an electric field force Fel; and (5) according to a formula of E=Fel/Nqe, obtaining an electric field intensity E. An apparatus for electric field measurement based on a levitated particle includes a high-voltage DC (direct current) power supply, two bare wire electrodes, a vacuum chamber, a trapping laser, an objective lens, a pair of parallel electrodes, a collective lens, a quadrant photodetector, a lock-in amplifier, a signal generator and a power amplifier.
Public/Granted literature
- US11789057B2 Method and apparatus for electric field measurement based on a levitated particle Public/Granted day:2023-10-17
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