Invention Publication
- Patent Title: Structured Film and Method of Using Same to Form a Pattern on a Substrate
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Application No.: US18255695Application Date: 2021-12-15
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Publication No.: US20240004282A1Publication Date: 2024-01-04
- Inventor: Martin B. Wolk , Robert L. Brott , Kevin W. Gotrik , Christopher S. Lyons , Caleb T. Nelson , Vadim Savvateev , James M. Nelson , Craig R. Schardt , Jeffrey L. Solomon , Karl K. Stensvad , Steven D. Theiss
- Applicant: 3M INNOVATIVE PROPERTIES COMPANY
- Applicant Address: US MN St. Paul
- Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee Address: US MN St. Paul
- International Application: PCT/IB21/61796 2021.12.15
- Date entered country: 2023-06-02
- Main IPC: G03F1/20
- IPC: G03F1/20 ; G03F7/09 ; G03F7/36

Abstract:
A structured film for forming a pattern on a substrate includes a polymeric support layer, an adhesive layer, an etch resist layer disposed between the polymeric support layer and the adhesive layer, a structured resin layer disposed between the polymeric support layer and the etch resist layer, and one or more unstructured layers disposed between the etch resist layer and the adhesive layer. The structured resin layer has a structured major surface including a plurality of engineered structures. The etch resist layer at least partially fills spaces between adjacent engineered structures to substantially planarize the structured major surface. Methods of using the structured film to form a pattern on a substrate are described.
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