Invention Publication
- Patent Title: MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE CHARGE LOSS STATE
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Application No.: US18370342Application Date: 2023-09-19
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Publication No.: US20240004567A1Publication Date: 2024-01-04
- Inventor: Patrick R. Khayat , Steven Michael Kientz , Sivagnanam Parthasarathy , Mustafa N. Kaynak , Vamsi Pavan Rayaprolu
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A processing device in a memory sub-system detects an occurrence of a triggering event, determines respective levels of charge loss associated with a first representative wordline of a block of a memory device and with a second representative wordline of the block of the memory device, and determines whether a difference between the respective levels of charge loss satisfies a threshold criterion. Responsive to determining that the difference between the respective levels of charge loss satisfies the threshold criterion, the processing device further determines that the block is in a uniform charge loss state.
Public/Granted literature
- US12223190B2 Measurement of representative charge loss in a block to determine charge loss state Public/Granted day:2025-02-11
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