Invention Publication
- Patent Title: DYNAMIC BLOCK CATEGORIZATION TO IMPROVE RELIABILITY AND PERFORMANCE IN MEMORY SUB-SYSTEM
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Application No.: US17867204Application Date: 2022-07-18
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Publication No.: US20240020020A1Publication Date: 2024-01-18
- Inventor: Sandeep Reddy Kadasani , Pitamber Shukla , Scott Anthony Stoller , Niccolo' Righetti
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F3/06
- IPC: G06F3/06
Abstract:
A set of threshold voltage distribution width measurements are obtained for a block in a memory device. An endurance estimate is determined for the block based on the threshold voltage distribution width measurements. The endurance estimate comprises an indication of an estimated number of program/erase cycles during which data can be reliably stored by the block. One or more parameters of the block are managed based on the endurance estimate.
Public/Granted literature
- US11972114B2 Dynamic block categorization to improve reliability and performance in memory sub-system Public/Granted day:2024-04-30
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