Invention Publication
- Patent Title: SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES
-
Application No.: US18476571Application Date: 2023-09-28
-
Publication No.: US20240030140A1Publication Date: 2024-01-25
- Inventor: YONG KONG SIEW , WEI HSIUNG TSENG , CHANGHWA KIM
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR SUWON-SI
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR SUWON-SI
- Priority: KR 20160128352 2016.10.05
- Main IPC: H01L23/535
- IPC: H01L23/535 ; H01L23/485 ; H01L21/768 ; H01L29/06 ; H01L29/417 ; H01L29/66 ; H01L29/78

Abstract:
A semiconductor device includes a substrate having an active region, a gate structure disposed on the active region, a source/drain region disposed in the active region at a side of the gate structure, a first interlayer insulating layer and a second interlayer insulating layer sequentially disposed on the gate structure and the source/drain region, a first contact plug connected to the source/drain region through the first interlayer insulating layer, a second contact plug connected to the gate structure through the first interlayer insulating layer and the second interlayer insulating layer, a first metal line disposed on the second interlayer insulating layer, and having a metal via disposed in the second interlayer insulating layer and connected to the first contact plug, and a second metal line disposed on the second interlayer insulating layer, and directly connected to the second contact plug.
Public/Granted literature
- US12132001B2 Semiconductor devices and methods of manufacturing semiconductor devices Public/Granted day:2024-10-29
Information query
IPC分类: