A semiconductor package includes a first memory device configured to output master data after the start of a training operation, and a second memory device configured to sample internal data based on the master data after the start of the training operation, configured to store test codes that adjust a time point at which the internal data are output when a time point at which the master data are output and the time point at which the internal data are output become identical with each other, and configured to program the stored test codes when the training operation is terminated.