Invention Publication
- Patent Title: Inertial Measurement Device
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Application No.: US18467306Application Date: 2023-09-14
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Publication No.: US20240093994A1Publication Date: 2024-03-21
- Inventor: Yoshiyuki MATSUURA
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP 22146827 2022.09.15
- Main IPC: G01C19/56
- IPC: G01C19/56 ; G01P1/00 ; G01P15/125 ; G01P15/18

Abstract:
An inertial measurement device includes: a first case and a second case; a board that is disposed in a space formed by the first case and the second case, that includes a first surface and a second surface, and in which a first inertial sensor is disposed at the first surface; a first filling material configured to fill between the first surface of the board and the first case and between the first inertial sensor and the first case; and a second filling material configured to fill between the second surface of the board and the second case.
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