Invention Publication
- Patent Title: STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, STRUCTURE EVALUATION METHOD, AND NON-TRANSITORY COMPUTER READABLE RECORDING MEDIUM
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Application No.: US18173235Application Date: 2023-02-23
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Publication No.: US20240094166A1Publication Date: 2024-03-21
- Inventor: Takashi USUI , Hidefumi TAKAMINE , Kazuo WATABE , Tetsuya KUGIMIYA
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Priority: JP 22148052 2022.09.16
- Main IPC: G01N29/14
- IPC: G01N29/14 ; G01N29/04 ; G01N29/44

Abstract:
According to one embodiment, a structure evaluation system according to an embodiment includes a plurality of sensors, a position locator, a corrector, and an evaluator. The plurality of sensors detect elastic waves generated from a structure. The position locator is configured to locate positions of sources of a plurality of elastic waves detected by the plurality of sensors on the basis of the plurality of elastic waves. The corrector is configured to correct information based on the position location in the position locator using a correction value which is determined according to a temperature of the structure. The evaluator is configured to evaluate a deterioration state of the structure on the basis of the corrected information.
Information query