Invention Publication

  • Patent Title: Transmission Electron Microscope
  • Application No.: US18368310
    Application Date: 2023-09-14
  • Publication No.: US20240096588A1
    Publication Date: 2024-03-21
  • Inventor: Kanako Noguchi
  • Applicant: JEOL Ltd.
  • Applicant Address: JP Tokyo
  • Assignee: JEOL Ltd.
  • Current Assignee: JEOL Ltd.
  • Current Assignee Address: JP Tokyo
  • Priority: JP 22147740 2022.09.16
  • Main IPC: H01J37/22
  • IPC: H01J37/22
Transmission Electron Microscope
Abstract:
A laser beam illumination equipment has a laser beam generation section and a mirror unit. An image generation section has a camera and a camera controller. A laser beam illumination control section sets a pulse period of a laser beam to the same period as an exposure period of the camera. With this configuration, a state change of a specimen can be set uniform over exposure durations. A pulse train of the laser beam may be generated based on a synchronization signal which is output from the camera controller.
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