Transmission Electron Microscope
    1.
    发明公开

    公开(公告)号:US20240096588A1

    公开(公告)日:2024-03-21

    申请号:US18368310

    申请日:2023-09-14

    Applicant: JEOL Ltd.

    Inventor: Kanako Noguchi

    CPC classification number: H01J37/228 H01J37/224 H01J2237/2802

    Abstract: A laser beam illumination equipment has a laser beam generation section and a mirror unit. An image generation section has a camera and a camera controller. A laser beam illumination control section sets a pulse period of a laser beam to the same period as an exposure period of the camera. With this configuration, a state change of a specimen can be set uniform over exposure durations. A pulse train of the laser beam may be generated based on a synchronization signal which is output from the camera controller.

    Charged Particle Beam Apparatus and Control Method for Charged Particle Beam Apparatus

    公开(公告)号:US20230290607A1

    公开(公告)日:2023-09-14

    申请号:US18120617

    申请日:2023-03-13

    Applicant: JEOL Ltd.

    CPC classification number: H01J37/28 H01J37/244 H01J37/265

    Abstract: A charged particle beam apparatus for scanning a specimen with a charged particle beam and acquiring a scan image. The charged particle beam apparatus including: an optical system that includes a pulse mechanism for illuminating the specimen with pulses of the charged particle beam, and a deflector that deflects the charged particle beam and scans the specimen with the deflected charged particle beam; and a control unit that controls the optical system. The control unit controls the optical system so as to satisfy T = n × t (n is a natural number). T represents a dwell time of the charged particle beam in each pixel of the scan image, and t represents a cycle of pulses of the charged particle beam.

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