Invention Publication
- Patent Title: SYSTEM FOR MONITORING DEFECTS WITHIN AN INTEGRATED SYSTEM PACKAGE
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Application No.: US18489737Application Date: 2023-10-17
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Publication No.: US20240133843A1Publication Date: 2024-04-25
- Inventor: Domenico GIUSTI , Marco DEL SARTO , Fabio QUAGLIA , Enri DUQI
- Applicant: STMICROELECTRONICS S.r.l.
- Applicant Address: IT Agrate Brianza
- Assignee: STMICROELECTRONICS S.r.l.
- Current Assignee: STMICROELECTRONICS S.r.l.
- Current Assignee Address: IT Agrate Brianza
- Priority: IT 2022000021900 2022.10.23
- Main IPC: G01N29/04
- IPC: G01N29/04 ; G01N29/24

Abstract:
An integrated electronic system is provided with a package formed by a support base and a coating region arranged on the support base and having at least a first system die, including semiconductor material, coupled to the support base and arranged in the coating region. The integrated electronic system also has, within the package, a monitoring system configured to determine the onset of defects within the coating region, through the emission of acoustic detection waves and the acquisition of corresponding received acoustic waves, whose characteristics are affected by, and therefore are indicative of, the aforementioned defects.
Public/Granted literature
- US20240230596A9 SYSTEM FOR MONITORING DEFECTS WITHIN AN INTEGRATED SYSTEM PACKAGE Public/Granted day:2024-07-11
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