- 专利标题: METHOD FOR PRODUCING AN OPTOELECTRONIC SEMICONDUCTOR COMPONENT AND OPTOELECTRONIC SEMICONDUCTOR COMPONENT
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申请号: US18546582申请日: 2022-02-23
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公开(公告)号: US20240136468A1公开(公告)日: 2024-04-25
- 发明人: Jens Ebbecke , Kristina Schelestow , Markus Graul , Hans-Joachim Meyer , Richard Floeter
- 申请人: ams-OSRAM International GmbH
- 申请人地址: DE Regensburg
- 专利权人: ams-OSRAM International GmbH
- 当前专利权人: ams-OSRAM International GmbH
- 当前专利权人地址: DE Regensburg
- 优先权: DE 2021104685.8 2021.02.26
- 国际申请: PCT/EP2022/054498 2022.02.23
- 进入国家日期: 2023-08-14
- 主分类号: H01L33/06
- IPC分类号: H01L33/06 ; H01L33/00 ; H01L33/02
摘要:
In an embodiment a method for producing an optoelectronic semiconductor component includes A) providing a semiconductor body comprising, sequentially in a vertical direction, a first layer of a first conductivity type, an active layer formed as a quantum well structure provided for emission of electromagnetic radiation, and a second layer of a second conductivity type and B) irradiating the semiconductor body with a focused electromagnetic radiation such that a focus region of the electromagnetic radiation lies within the active layer and overlaps with the quantum well structure, wherein the electromagnetic radiation has an intensity which is sufficiently large in the focus region to cause point defects in the quantum well structure so that a defect region is formed and so that a generation of the point defects is limited to the focus region, and wherein a density of point defects in the first layer and the second layer is not changed in B).
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