Invention Publication
- Patent Title: APPARATUS FOR MEASURING RADICAL DENSITY DISTRIBUTION BASED ON LIGHT ABSORPTION AND OPERATING METHOD THEREOF
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Application No.: US18202663Application Date: 2023-05-26
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Publication No.: US20240159657A1Publication Date: 2024-05-16
- Inventor: Sejin OH , Sunggil KANG , Sangki NAM , Jeongmin BANG , Dougyong SUNG , Yeongkwang LEE , Sungho JANG , Jonghun PI
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR 20220151905 2022.11.14
- Main IPC: G01N21/25
- IPC: G01N21/25 ; G01N21/31 ; H01L21/67

Abstract:
Provided is an apparatus configured to measure radical spatial density distribution including a process chamber including a viewport, a driving device configured to move a moving wall inside the process chamber, a light source configured to generate light, a collimator disposed in the viewport of the process chamber and configured to transmit light received from the light source to the moving wall and receive light reflected from the moving wall, and a spectrometer configured to receive the reflected light from the collimator, and measure radical spatial density based on analyzing an absorption amount of a spectrum of the received light.
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