A test and measurement instrument includes a port to connect to a device under test (DUT) to receive waveform data, a connection to a machine learning network, and one or more processors configured to: receive one or more inputs about a three-dimensional (3D) tensor image; scale the waveform data to fit within the 3D tensor image; build the 3D tensor image; send the 3D tensor image to the machine learning network; and receive a predictive result from the machine learning network. A method includes receiving waveform data from one or more device under test (DUT), receiving one or more inputs about a three-dimensional (3D) tensor image, scaling the waveform data to fit within the 3D tensor image, building the 3D tensor image, sending the 3D tensor image to a pre-trained machine learning network, and receiving a predictive result from the machine learning network.