- 专利标题: PREDICTION SYSTEM, PREDICTION APPARATUS, AND PREDICTION METHOD
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申请号: US18528447申请日: 2023-12-04
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公开(公告)号: US20240193796A1公开(公告)日: 2024-06-13
- 发明人: Katsuhiro YUTANI
- 申请人: NEC Corporation
- 申请人地址: JP Tokyo
- 专利权人: NEC Corporation
- 当前专利权人: NEC Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP 22197374 2022.12.09
- 主分类号: G06T7/246
- IPC分类号: G06T7/246 ; G06T7/521 ; G06T7/564
摘要:
An acquisition means repeatedly acquires three-dimensional data of a monitoring target surface on a time axis. A deformation detection means detects, based on a plurality of pieces of the three-dimensional data, a first deformation occurring at a first time, and a second deformation occurring at a position different from an occurrence position of the first deformation at a second time being after the first time. A deformation prediction means predicts, based on a detection result by the deformation detection means, that a third deformation may occur in a future at a position different from occurrence positions of the first deformation and the second deformation.
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