Invention Publication
- Patent Title: ION GENERATOR, MASS SPECTROMETER AND METHOD OF GENERATING IONS
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Application No.: US18541196Application Date: 2023-12-15
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Publication No.: US20240213012A1Publication Date: 2024-06-27
- Inventor: Wenjian SUN , Zhi Geng
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi
- Priority: CN 2211666403.0 2022.12.23
- Main IPC: H01J49/16
- IPC: H01J49/16

Abstract:
The technical solution of the present disclosure provides an ion generator for dissociating sample ions for the second time by laser, of which the dissociation efficiency is further improved with a lower cost. The ion generator includes: a desorption device configured to desorb sample particles into a pre-determined area; a light source emitting a light beam and focusing the light beam to the pre-determined area, thereby ionizing, fragmenting or atomizing the sample particles in the pre-determined area; and a focusing reflector for reflecting the light beam that is emitted by the light source and travels through the pre-determined area, and focusing the light beam to the pre-determined area, thereby ionizing, fragmenting or atomizing the sample particles in the pre-determined area at least once again, during which each time the light beam is reflected on the surface of the focusing reflector, the light beam is focused to the pre-determined area correspondingly.
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