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公开(公告)号:US20240213012A1
公开(公告)日:2024-06-27
申请号:US18541196
申请日:2023-12-15
Applicant: SHIMADZU CORPORATION
Inventor: Wenjian SUN , Zhi Geng
IPC: H01J49/16
CPC classification number: H01J49/164
Abstract: The technical solution of the present disclosure provides an ion generator for dissociating sample ions for the second time by laser, of which the dissociation efficiency is further improved with a lower cost. The ion generator includes: a desorption device configured to desorb sample particles into a pre-determined area; a light source emitting a light beam and focusing the light beam to the pre-determined area, thereby ionizing, fragmenting or atomizing the sample particles in the pre-determined area; and a focusing reflector for reflecting the light beam that is emitted by the light source and travels through the pre-determined area, and focusing the light beam to the pre-determined area, thereby ionizing, fragmenting or atomizing the sample particles in the pre-determined area at least once again, during which each time the light beam is reflected on the surface of the focusing reflector, the light beam is focused to the pre-determined area correspondingly.
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公开(公告)号:US20240213011A1
公开(公告)日:2024-06-27
申请号:US18508669
申请日:2023-11-14
Applicant: SHIMADZU CORPORATION
Inventor: Xiaoqiang ZHANG , Zhi Geng , Wenjian Sun
CPC classification number: H01J49/063 , H01J49/24
Abstract: The technical solution of the present disclosure provides an ion source apparatus and a mass spectrometer. According to the ion source apparatus, the axial ion guide assembly includes the plurality of multipole segments extending axially, the transmission path of axial ions is straight, and the ion transmission efficiency is substantially unaffected when the axial ion source is used alone. Further, since the ion outlet of the lateral ion guide assembly faces a gap between two adjacent segmented multipoles, the lateral ion guide assembly does not affect axial field, thereby integrating the multiple ion sources while ensuring the ion transmission efficiency and ion constraining of the axial ion source.
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