发明公开
- 专利标题： CIRCUIT AND METHOD FOR MEASURING AND CORRECTING SIGNAL OFFSET AT TWO POINTS
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申请号： US18154170申请日： 2023-01-13
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公开(公告)号： US20240243713A1公开(公告)日： 2024-07-18
- 发明人: Laszlo Szilagyi , Stefan Manolov Stefanov , Torsten Gross
- 申请人： GlobalFoundries Dresden Module One Limited Liability Company & Co. KG
- 申请人地址： DE Dresden
- 专利权人： GlobalFoundries Dresden Module One Limited Liability Company & Co. KG
- 当前专利权人： GlobalFoundries Dresden Module One Limited Liability Company & Co. KG
- 当前专利权人地址： DE Dresden
- 主分类号： H03F3/45
- IPC分类号： H03F3/45 ; H03F1/26 ; H03F3/08 ; H04B10/69
摘要：
A circuit structure including: a first amplifier stage having an input, and a second amplifier stage connected to the first amplifier stage. The second amplifier stage has an output. The first amplifier stage and the second amplifier stage carry a signal. A controller is configured to measure and modify at least one operational parameter of the signal. A first offset polarity detector-low pass filter (OPD-LPF) circuit connects the second amplifier stage output to the controller through a first controller input. A second OPD-LPF circuit connects the second amplifier stage to the controller through a second controller input. The controller measures an operational parameter of the signal for offset based on input from the first OPD-LPF circuit and the second OPD-LPF circuit. The controller modifies the operational parameter of the signal to correct signal offset.
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