• Patent Title: X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
  • Application No.: US18562508
    Application Date: 2022-05-24
  • Publication No.: US20240248050A1
    Publication Date: 2024-07-25
  • Inventor: Peter HOGHOJKarsten JOENSENPierre PANINE
  • Applicant: XENOCS SAS
  • Applicant Address: FR Grenoble
  • Assignee: XENOCS SAS
  • Current Assignee: XENOCS SAS
  • Current Assignee Address: FR Grenoble
  • Priority: EP 315088.1 2021.05.25
  • International Application: PCT/EP2022/064053 2022.05.24
  • Date entered country: 2023-11-20
  • Main IPC: G01N23/201
  • IPC: G01N23/201 G01N23/20008
X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
Abstract:
An X-ray scattering apparatus has a sample vacuum chamber, a sample holder placed inside the sample vacuum chamber for aligning and/or orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system having a 2D X-ray source and a 2D monochromator and being arranged upstream of the sample holder for generating and directing an X-ray beam along a beam path in a propagation direction towards the sample holder. An X-ray detector placed inside a diffraction chamber connected to the sample vacuum chamber where the X-ray detector is arranged downstream of the sample holder and is movable, in a motorized way, along the propagation direction so as to detect the X-ray beam and X-rays scattered at different scattering angles, where the X-ray beam delivery system is configured to focus the X-ray beam onto a focal spot on or near the X-ray detector when placed at its distal position.
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