公开(公告)号：US20240248050A1

公开(公告)日：2024-07-25

申请号：US18562508

申请日：2022-05-24

Applicant: XENOCS SAS

Inventor： Peter HOGHOJ ,  Karsten JOENSEN ,  Pierre PANINE

IPC: G01N23/201 ,  G01N23/20008

CPC classification number: G01N23/201 ,  G01N23/20008 ,  G01N2223/33

Abstract: An X-ray scattering apparatus has a sample vacuum chamber, a sample holder placed inside the sample vacuum chamber for aligning and/or orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system having a 2D X-ray source and a 2D monochromator and being arranged upstream of the sample holder for generating and directing an X-ray beam along a beam path in a propagation direction towards the sample holder. An X-ray detector placed inside a diffraction chamber connected to the sample vacuum chamber where the X-ray detector is arranged downstream of the sample holder and is movable, in a motorized way, along the propagation direction so as to detect the X-ray beam and X-rays scattered at different scattering angles, where the X-ray beam delivery system is configured to focus the X-ray beam onto a focal spot on or near the X-ray detector when placed at its distal position.