Invention Publication
- Patent Title: MULTI-VIEW LUMINANCE MEASURING DEVICE AND METHOD FOR MEASURING MULTI-VIEW LUMINANCE
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Application No.: US18416972Application Date: 2024-01-19
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Publication No.: US20240272002A1Publication Date: 2024-08-15
- Inventor: Young Min PARK , O Jun KWON , Jae Joong KWON , Jin SEO , A Ree SONG , Eun Jung LEE , Ha Young LEE , Young Sang HA
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin-si
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-si
- Priority: KR 20230019683 2023.02.14
- Main IPC: G01J3/50
- IPC: G01J3/50 ; H04N13/305 ; H04N13/351

Abstract:
A multi-view luminance measuring device includes: a base substrate having a long side extending in a first direction and a short side extending in a second direction, wherein the long side is curved with a first curvature; a plurality of lenses positioned on an inner surface of the base substrate; and a plurality of optical sensors positioned on the base substrate to respectively correspond to the plurality of lenses, wherein the first curvature is set such that a distance between each of the plurality of lenses and a target point is constant, and wherein a length of the long side of the base substrate is set to cover a viewing angle with reference to the target point.
Public/Granted literature
- US12298185B2 Multi-view luminance measuring device and method for measuring multi-view luminance Public/Granted day:2025-05-13
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