发明公开
- 专利标题: ETCHING SOLUTION COMPOSITION
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申请号: US18569249申请日: 2022-03-30
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公开(公告)号: US20240279548A1公开(公告)日: 2024-08-22
- 发明人: Sho NAGAO , Tomohiro INOUE , Takao MITSUI , Nobuhiro OSHITA , Reiji UCHIDA
- 申请人: RASA INDUSTRIES, LTD.
- 申请人地址: JP Tokyo
- 专利权人: RASA INDUSTRIES, LTD.
- 当前专利权人: RASA INDUSTRIES, LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP 21098603 2021.06.14
- 国际申请: PCT/JP2022/015849 2022.03.30
- 进入国家日期: 2023-12-12
- 主分类号: C09K13/06
- IPC分类号: C09K13/06
摘要:
Provided is an etching solution composition that can have both a higher etch selectivity of silicon nitride and a reduction in the deposition of silica on the surface of silicon oxide. An inorganic acid-based etching solution composition for selectively etching away silicon nitride from a semiconductor containing silicon nitride and silicon oxide, the etching solution composition comprising: (a) an etch inhibitor that reduces etching of silicon oxide; and (b) a deposition inhibitor that reduces deposition of silica on a surface of silicon oxide.
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