Invention Publication
- Patent Title: IN-SITU DATA ANALYSIS IN GRAPH-BASED MODELS
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Application No.: US18587412Application Date: 2024-02-26
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Publication No.: US20240289327A1Publication Date: 2024-08-29
- Inventor: Steven SCHILDERS
- Applicant: INFOSYS LIMITED
- Applicant Address: IN Bangalore
- Assignee: INFOSYS LIMITED,InvertIT Inc.
- Current Assignee: INFOSYS LIMITED,InvertIT Inc.
- Current Assignee Address: IN Bangalore; US IN Columbus
- Main IPC: G06F16/2452
- IPC: G06F16/2452 ; G06F16/215

Abstract:
An overlay system is provided that includes a storage element and processing circuitry coupled thereto. The storage element stores an executable graph-based model including a plurality of nodes, a plurality of rule overlay nodes, and a plurality of data analysis overlay nodes. The processing circuitry receives a stimulus indicative of a data analysis operation and identifies a first node, a rule overlay node associated with the first node, and a data analysis overlay node associated with the first node. The processing circuitry executes a set of rules associated with the rule overlay node on a composition of the first node to generate a set of outputs. The data analysis overlay node uses the set of outputs to determine whether a data analysis score associated with the first node exceeds a data analysis score threshold.
Public/Granted literature
- US12216652B2 In-situ data analysis in graph-based models Public/Granted day:2025-02-04
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