Invention Publication
- Patent Title: MEMORY BLOCK CHARACTERISTIC DETERMINATION
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Application No.: US18659845Application Date: 2024-05-09
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Publication No.: US20240296892A1Publication Date: 2024-09-05
- Inventor: Zhongyuan Lu , Niccolo' Righetti
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G11C16/16
- IPC: G11C16/16 ; G11C7/04 ; G11C16/08 ; G11C16/26 ; G11C16/32

Abstract:
Bake temperatures for memory blocks can be determined as part of an operation to allocate memory blocks for us by a memory device. If a temperature of a particular memory block among the plurality of memory blocks meets or exceeds a threshold operational temperature corresponding to a memory device containing the plurality of memory blocks, the particular memory block can be allocated for receipt and/or storage of data.
Information query