Various implementations described herein are related to a device with fabrication test circuitry having transistors arranged in a parallel branch configuration between a supply voltage and a single pad. In some applications, each transistor in an off-current branch may be separately deactivated so as to test leakage current applied to the pad by way of the off-current branch, and also, each transistor in an on-current branch may be deactivated so as to further test the leakage current applied to the pad by way of the off-current branch.