- 专利标题: ADAPTIVE SCANNING OF MEMORY DEVICES WITH SUPERVISED LEARNING
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申请号: US18739982申请日: 2024-06-11
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公开(公告)号: US20240329852A1公开(公告)日: 2024-10-03
- 发明人: Li-Te Chang , Murong Lang , Charles See Yeung Kwong , Vamsi Pavan Rayaprolu , Seungjune Jeon , Zhenming Zhou
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 主分类号: G06F3/06
- IPC分类号: G06F3/06 ; G06N20/00
摘要:
A processing device in a memory sub-system determines one or more read margin levels associated with the memory device. A machine learning model is applied to the one or more read margin levels to generate a read margin prediction value associated with the memory device. Based on the margin prediction value, the memory device is assigned to a selected bin of a set of bins. A media scan operation is executed on the memory device in accordance with a scan frequency associated with the selected bin.
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