Invention Publication
- Patent Title: INTERCONNECTION STRUCTURE
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Application No.: US18746055Application Date: 2024-06-18
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Publication No.: US20240339397A1Publication Date: 2024-10-10
- Inventor: Min-Shiang Hsu , Yu-Han Tsai , Chih-Sheng Chang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu City
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu City
- Priority: TW 1100119 2022.01.03
- The original application number of the division: US17670520 2022.02.14
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768

Abstract:
An interconnection structure includes a first interconnection level, a second interconnection level, a third interconnection level, and a super via structure. The second interconnection level is disposed on the first interconnection level, and the third interconnection level is disposed on the second interconnection level. The second interconnection level includes a second conductive layer and a block layer disposed in a dielectric layer. A bottom surface of the block layer is lower than a top surface of the second conductive layer in a vertical direction. The block layer is disposed between a first conductive layer of the first interconnection level and a third conductive layer of the third interconnection level in the vertical direction. The super via structure penetrates through the block layer and the second interconnection level in the vertical direction and electrically connects the first conductive layer and the third conductive layer.
Information query
IPC分类: