Invention Application
- Patent Title: GANGED SINGLE LEVEL CELL VERIFY IN A MEMORY DEVICE
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Application No.: US18780167Application Date: 2024-07-22
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Publication No.: US20240379178A1Publication Date: 2024-11-14
- Inventor: Eric N. Lee , Tomoko Ogura Iwasaki
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/08 ; G11C16/10 ; G11C16/24 ; G11C16/26 ; G11C16/30

Abstract:
Control logic in a memory device identifies a set of memory cells in a block of a memory array, wherein the set of memory cells comprises two or more memory cells programmed during a program phase of a program operation and associated with a selected wordline of the memory array. The control logic further causes a program verify voltage to be applied to the selected wordline during a program verify phase of the program operation and performs concurrent sensing operations on the set of memory cells to determine whether each memory cell in the set of memory cells was programmed to at least the program verify voltage during the program phase of the program operation.
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