Invention Application
- Patent Title: METHOD FOR ADJUSTING THE POSITION OF PROBING BASE AND PROBING MACHINE USING THE SAME
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Application No.: US18672151Application Date: 2024-05-23
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Publication No.: US20240393386A1Publication Date: 2024-11-28
- Inventor: YA-HUNG LO , CHIEN-HSUN CHEN , SHOU-JEN TSAI , FUH-CHYUN TANG
- Applicant: MPI Corporation
- Applicant Address: TW Zhubei City
- Assignee: MPI Corporation
- Current Assignee: MPI Corporation
- Current Assignee Address: TW Zhubei City
- Priority: TW112119415 20230524
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A method for adjusting position of probing base comprises steps of providing a probing machine comprising a probing holder, a first probing base having a first probing needle comprising a plurality of first probing bodies wherein two adjacent tips of the first probing bodies h a first pitch, and a second probing base having a second probe comprising a plurality of second probing bodies in which two adjacent tips of the second probing bodies has a second pitch, thereafter, grabbing the first probing base and connecting the first probing base to the probing holder, acquiring first image with respect to the plurality of first probing bodies through visual identification module, and finally, adjusting roll angle of probing tips of the plurality of first needle bodies according to the first image. Alternatively, the present invention further provides a probing machine using the method for testing DUTs having different pitches.
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