METHOD FOR FABRICATING MASK, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
Abstract:
A method for fabricating mask is provided. The method includes generating a second target pattern from a first target pattern, where the first target pattern includes first straight edges, and the second target pattern includes second straight edges and curved edges. Optical proximity correction is performed on the second target pattern to generating a mask pattern. The mask is fabricated using the mask pattern. Generating the second target pattern includes changing corner portions of the first target pattern into a curve to generate the curved edges.
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