Invention Application
- Patent Title: CRYSTAL FORM DETERMINATION METHOD
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Application No.: US18703413Application Date: 2022-10-26
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Publication No.: US20240418641A1Publication Date: 2024-12-19
- Inventor: Kazuhiro TAKAHASHI , Kouichiro AKIYAMA , Hiroshi SATOZONO
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Priority: JP2021-175526 20211027
- International Application: PCT/JP2022/040011 WO 20221026
- Main IPC: G01N21/3581
- IPC: G01N21/3581 ; G01N21/3563

Abstract:
A crystal form determination method includes a first process of preparing a measurement target object; a second process of entering a terahertz wave to the measurement target object and detecting the terahertz wave from the measurement target object to acquire a plurality of detection results corresponding to a plurality of times separated from each other; and a third process of determining a type of crystal form contained in the measurement target object. In the third process, when a frequency characteristic having a third peak at a third frequency different from a first frequency related to a first peak corresponding to an anhydride and a second frequency related to a second peak corresponding to a hydrate exists among the plurality of frequency characteristics, determination is made that the crystal form different from the anhydride and the hydrate is contained in the measurement target object.
Information query
IPC分类: