Invention Application
- Patent Title: METHOD OF FORMING INSULATING FILM BY USING ATOMIC LAYER DEPOSITION
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Application No.: US18504712Application Date: 2023-11-08
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Publication No.: US20240429043A1Publication Date: 2024-12-26
- Inventor: Jeonggyu SONG , Ilkwon OH , Beomseok KIM , Jooho LEE , Wonsik CHOI , Byungjun WON , Minjeong RHEE
- Applicant: Samsung Electronics Co., Ltd. , AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Applicant Address: KR Suwon-si; KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.,AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Current Assignee: Samsung Electronics Co., Ltd.,AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Current Assignee Address: KR Suwon-si; KR Suwon-si
- Priority: KR10-2023-0079932 20230621
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/34 ; C23C16/40 ; C23C16/455

Abstract:
Provided is a method of forming an insulating film on a substrate by using atomic layer deposition (ALD). The method of forming an insulating film on a substrate by using ALD includes transferring a deposition-hindering material to the substrate, and depositing a first material layer by transferring a first precursor to the deposition-hindering material, wherein the deposition-hindering material includes an organic ligand, and the first precursor includes an alkoxide ligand.
Information query
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