Invention Application
- Patent Title: ANALOG-TO-DIGITAL CONVERTER AND OFFSET CORRECTION METHOD THEREOF
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Application No.: US18666180Application Date: 2024-05-16
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Publication No.: US20250030430A1Publication Date: 2025-01-23
- Inventor: Heewook Shin , Jaehyuk Lee , Junho Boo , Seunghoon Lee , Youngjae Cho , Michael Choi , Jinwook Burm , Gilcho Ahn
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR SUWON-SI
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR SUWON-SI
- Priority: KR10-2023-0093957 20230719,KR10-2023-0109344 20230821
- Main IPC: H03M1/06
- IPC: H03M1/06

Abstract:
Provided is an analog-to-digital converter and a voltage offset correction method thereof. The analog-to-digital converter may include a digital-to-analog converter (DAC) configured to generate a first comparison voltage, a comparison circuit configured to output a first comparison result signal based on a result of comparing the first comparison voltage with a second comparison voltage, and a control circuit configured to control the DAC and output an output signal, wherein the DAC may include a correction circuit configured to generate a correction voltage by selectively switching switches connected to terminals to which a plurality of reference voltages are applied, and correct a voltage offset of the comparison circuit based on the correction voltage.
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