Invention Application
- Patent Title: CLEANING DEVICE FOR WAFER-SUCTION CHUCK MECHANISM
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Application No.: US18283167Application Date: 2021-12-14
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Publication No.: US20250065377A1Publication Date: 2025-02-27
- Inventor: Junichi FUKUSHIMA
- Applicant: TOKYO SEIMITSU CO., LTD.
- Applicant Address: JP Hachioji-shi, Tokyo
- Assignee: TOKYO SEIMITSU CO., LTD.
- Current Assignee: TOKYO SEIMITSU CO., LTD.
- Current Assignee Address: JP Hachioji-shi, Tokyo
- Priority: JP2021-054214 20210326
- International Application: PCT/JP2021/045924 WO 20211214
- Main IPC: B08B1/16
- IPC: B08B1/16 ; B08B1/12 ; B08B3/02

Abstract:
A cleaning device for a wafer-suction chuck mechanism capable of automatically and simply performing cleaning treatment on a chuck surface that suction-holds a wafer and cleaning treatment on a frame suction-holding section. The cleaning device is configured to include a scraper 17 and a brush 18 that press frame suction-holding section cleaning means 10B for removing a sludge on a frame suction-holding section 11B onto the frame suction-holding section 11B, and a water nozzle 19 that discharges and supplies water onto the frame suction-holding section 11B.
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