This disclosure describes systems, methods, and devices related to optimized delay measurement. A device may receive a request from a consumer to create a Trace job for collecting delay-related measurements from a User Plane Function (UPF). The device may request a Unified Data Management (UDM) system to create the Trace job. The device may receive a response about a result of the Trace job creation from the UDM. The device may send a response indicating the result of the Trace job creation to the consumer.