Invention Grant
- Patent Title: Diode comparison gate
- Patent Title (中): 二极管比较门
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Application No.: US62943556Application Date: 1956-12-18
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Publication No.: US2912582APublication Date: 1959-11-10
- Inventor: DAVEY JAMES R
- Applicant: BELL TELEPHONE LABOR INC
- Assignee: Nokia Bell Labs
- Current Assignee: Nokia Bell Labs
- Priority: US62943556 1956-12-18
- Main IPC: G06F7/02
- IPC: G06F7/02 ; H03K19/12
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