X-ray thickness gauge with correction for specimen composition

Invention Grant

US3417244A X-ray thickness gauge with correction for specimen composition 失效

Title translation: X射线测厚仪，用于样品组成的校正

Patent Title: X-ray thickness gauge with correction for specimen composition
Patent Title (中): X射线测厚仪，用于样品组成的校正
Application No.: US57147766

Application Date: 1966-08-10
Publication No.: US3417244A

Publication Date: 1968-12-17
Inventor: KRAMER MAX J
Applicant: ALUMINUM CO OF AMERICA
Assignee: Aluminum Co Of America
Current Assignee: Aluminum Co Of America
Priority: US57147766 1966-08-10
Main IPC: G01N23/16
IPC: G01N23/16

Information query

Espacenet

IPC分类:

G	物理
G01	测量；测试
G01N	借助于测定材料的化学或物理性质来测试或分析材料（除免疫测定法以外包括酶或微生物的测量或试验入C12M，C12Q）
G01N23/00	利用波或粒子辐射来测试或分析材料，例如未包括在G01N3/00-G01N17/00、G01N 21/00 或G01N 22/00中的X射线或中子
G01N23/02	.通过使辐射透过材料
G01N23/06	..并测量吸收
G01N23/16	...材料是移动的板或薄膜