发明授权
- 专利标题: Dual growth rate method of depositing epitaxial crystalline layers
- 专利标题(中): 沉积外延晶体层的双生长速率法
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申请号: US38919273申请日: 1973-08-17
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公开(公告)号: US3885061A公开(公告)日: 1975-05-20
- 发明人: CORBOY JOHN FRANCIS , CULLEN GLENN WHERRY , PASTAL NICHOLAS
- 申请人: RCA CORP
- 专利权人: RCA Corp
- 当前专利权人: RCA Corp
- 优先权: US38919273 1973-08-17
- 主分类号: C30B25/02
- IPC分类号: C30B25/02 ; C23C16/44 ; C30B29/06 ; H01L21/20 ; H01L21/205 ; H01L21/86 ; H01L27/12 ; C23C11/00
摘要:
Method of forming an epitaxial crystalline layer on a crystalline substrate by depositing a first portion at a rapid growth rate and a second portion at a slower growth rate.
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