发明授权
US4043177A Method to observe damage induced in optical elements by intense thermal
radiation
失效
通过强烈的热辐射观察光学元件引起的损伤的方法
- 专利标题： Method to observe damage induced in optical elements by intense thermal radiation
- 专利标题（中）： 通过强烈的热辐射观察光学元件引起的损伤的方法
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申请号： US679309申请日： 1976-04-22
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公开(公告)号： US4043177A公开(公告)日： 1977-08-23
- 发明人: Roderick D. Swift
- 申请人： Roderick D. Swift
- 申请人地址： DC Washington
- 专利权人： The United States of America as represented by the Secretary of the Army
- 当前专利权人： The United States of America as represented by the Secretary of the Army
- 当前专利权人地址： DC Washington
- 主分类号： G01M11/00
- IPC分类号： G01M11/00 ; G01N21/88 ; G01N25/00
摘要：
A system by which in situ observations of optical damage induced in opticalomponents by intense thermal radiation may be made. The process includes the determination of the spectral transmission wherein a scanning monochromator is used to illuminate the sample elements with a light beam of monotonically changing wavelength, and the transmitted light is detected and its intensity recorded as a function of wavelength. Optical damage is detected by the resultant changes in the spectral transmission curve.
公开/授权文献
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