发明授权
- 专利标题： Scanning X-ray examination apparatus
- 专利标题（中）： 扫描X射线检查装置
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申请号： US642159申请日： 1975-12-18
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公开(公告)号： US4051377A公开(公告)日： 1977-09-27
- 发明人: Rudolf Kemner , Frans Wessel Zonneveld
- 申请人： Rudolf Kemner , Frans Wessel Zonneveld
- 申请人地址： NY New York
- 专利权人： U.S. Philips Corporation
- 当前专利权人： U.S. Philips Corporation
- 当前专利权人地址： NY New York
- 优先权： NL7416756 19741223
- 主分类号： A61B6/00
- IPC分类号： A61B6/00 ; A61B6/03 ; G01N23/04 ; H04N7/18 ; H05G1/30 ; H05G1/36 ; H05G1/34
摘要：
The output dose behind the body to be examined in a scanning X-ray examination device is kept constant by controlling the incident dose. As a result, in comparison with known devices an examination can be performed quicker and with a smaller total radiation dose, and a better image of the absorption variations can be obtained.
公开/授权文献
- US4557205A Fur sewing machine with heated air blower 公开/授权日：1985-12-10