发明授权
US4099054A SEM having D-C bias of video signal controlled by maximum and/or minimum
of CRT beam current
失效
具有最大和/或最小CRT射束电流控制的视频信号的D-C偏移的SEM
- 专利标题: SEM having D-C bias of video signal controlled by maximum and/or minimum of CRT beam current
- 专利标题(中): 具有最大和/或最小CRT射束电流控制的视频信号的D-C偏移的SEM
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申请号: US810163申请日: 1977-06-27
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公开(公告)号: US4099054A公开(公告)日: 1978-07-04
- 发明人: Masahide Okumura , Yasushi Saito
- 申请人: Masahide Okumura , Yasushi Saito
- 申请人地址: JP
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP
- 优先权: JP49-132759 19741120
- 主分类号: G01N23/225
- IPC分类号: G01N23/225 ; H01J37/256 ; G01N23/00
摘要:
A charged particle apparatus wherein a charged particle beam irradiates an object to be observed and secondary emissions such as secondary electrons thus emitted from a surface layer of the object are detected. A signal indicative of the detected secondary emissions is applied to a control grid of a cathode ray tube to modulate an electron beam irradiating a fluorescent screen thereof. A detector detects the electron beam intensity of the cathode ray tube and minimum and maximum or peak values of the detected electron beam intensity are compared with predetermined reference signals to obtain deviation signals indicative of the difference therebetween. The signal applied to the control grid of the cathode ray tube is controlled in accordance with the deviation signals.
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