发明授权
US4099054A SEM having D-C bias of video signal controlled by maximum and/or minimum of CRT beam current 失效
具有最大和/或最小CRT射束电流控制的视频信号的D-C偏移的SEM

SEM having D-C bias of video signal controlled by maximum and/or minimum
of CRT beam current
摘要:
A charged particle apparatus wherein a charged particle beam irradiates an object to be observed and secondary emissions such as secondary electrons thus emitted from a surface layer of the object are detected. A signal indicative of the detected secondary emissions is applied to a control grid of a cathode ray tube to modulate an electron beam irradiating a fluorescent screen thereof. A detector detects the electron beam intensity of the cathode ray tube and minimum and maximum or peak values of the detected electron beam intensity are compared with predetermined reference signals to obtain deviation signals indicative of the difference therebetween. The signal applied to the control grid of the cathode ray tube is controlled in accordance with the deviation signals.
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