发明授权
- 专利标题: Selective lift-off technique for fabricating GaAs FETs
- 专利标题(中): 选择放样技术制造GAAS FET
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申请号: US794336申请日: 1977-05-06
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公开(公告)号: US4111725A公开(公告)日: 1978-09-05
- 发明人: Alfred Yi Cho , James Vincent DiLorenzo , Gerard Edward Mahoney
- 申请人: Alfred Yi Cho , James Vincent DiLorenzo , Gerard Edward Mahoney
- 申请人地址: NJ Murray Hill
- 专利权人: Bell Telephone Laboratories, Incorporated
- 当前专利权人: Bell Telephone Laboratories, Incorporated
- 当前专利权人地址: NJ Murray Hill
- 主分类号: H01L21/203
- IPC分类号: H01L21/203 ; H01L21/306 ; H01L21/338 ; H01L29/812 ; H01L21/20
摘要:
MBE growth of epitaxial layers on selected areas of a growth surface (e.g., wafer or epi-layer grown thereon) is achieved by masking portions of the surface with an amorphous material and directing molecular beams at the masked surface so that a polycrystalline layer deposits on the mask and an epi-layer grows in the unmasked zones. The mask material is then exposed to a suitable etchant effective to dissolve that material, lift-off the polycrystalline layer and expose the underlying surface. Self-aligned contacts can be fabricated by depositing a metal layer prior to etching. Subsequent lift-off removes both the polycrystalline layer and the overlying metal. This process can be utilized in the fabrication of FETs and opto-electronic devices such as double heterostructure junction lasers.
公开/授权文献
- US5846037A Quick tool release mechanism for vertical milling machines 公开/授权日:1998-12-08
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