发明授权
- 专利标题: Semiconductor detector for detecting ionizing radiation
- 专利标题(中): 用于检测电离辐射的半导体检测器
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申请号: US773834申请日: 1977-03-02
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公开(公告)号: US4122345A公开(公告)日: 1978-10-24
- 发明人: Henri Rougeot
- 申请人: Henri Rougeot
- 申请人地址: FRX Paris
- 专利权人: Thomson-CSF
- 当前专利权人: Thomson-CSF
- 当前专利权人地址: FRX Paris
- 优先权: FRX7606717 19760309
- 主分类号: G01T1/20
- IPC分类号: G01T1/20 ; H01G9/20 ; H01L31/0232 ; H01L31/0352 ; H01L31/118 ; G01T1/22
摘要:
The invention relates to a semiconductor detector for detecting ionizing radiation. The surface barrier required for the formation of field zones in the semiconductor body (1) is created by contact between the semiconductor body (1) and an electrolyte (3) in which it is immersed. In addition, the body is cut out, in the form of a comb in the example, in such a way as to increase its active surface as much as possible. The source (8) maintains the potential difference V.sub.o between the contact (5) on the body (1) and the cathode (7). The output signal s is extracted at (6).
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