发明授权
US4242632A Method and apparatus for testing axial-lead components 失效
用于测试轴向引线部件的方法和装置

  • 专利标题: Method and apparatus for testing axial-lead components
  • 专利标题(中): 用于测试轴向引线部件的方法和装置
  • 申请号: US940966
    申请日: 1978-09-11
  • 公开(公告)号: US4242632A
    公开(公告)日: 1980-12-30
  • 发明人: Robert A. Irvin
  • 申请人: Robert A. Irvin
  • 申请人地址: MA Burlington
  • 专利权人: Semicon, Inc.
  • 当前专利权人: Semicon, Inc.
  • 当前专利权人地址: MA Burlington
  • 主分类号: G01R31/02
  • IPC分类号: G01R31/02 G01R31/26
Method and apparatus for testing axial-lead components
摘要:
A method and apparatus for pre-stress testing a large number of electrical components having axial leads. The components are aligned in parallel so that the leads at one end terminate in approximately one plane and the leads at the other end terminate approximately in a second plane parallel to the first one. A pair of planar electrodes are applied to the respective ends of the leads and the electrodes are connected to the power source that applies the desired test voltage.
公开/授权文献
信息查询
0/0