发明授权
- 专利标题: Temperature measuring arrangements for microwave ovens
- 专利标题(中): 微波炉温度测量装置
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申请号: US55759申请日: 1979-07-09
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公开(公告)号: US4286134A公开(公告)日: 1981-08-25
- 发明人: Takeshi Nakata , Takashi Watanabe , Kiyoshi Harada
- 申请人: Takeshi Nakata , Takashi Watanabe , Kiyoshi Harada
- 申请人地址: JPX Osaka
- 专利权人: Sanyo Electric Co., Ltd.
- 当前专利权人: Sanyo Electric Co., Ltd.
- 当前专利权人地址: JPX Osaka
- 优先权: JPX53-97531[U] 19780713
- 主分类号: G01J5/00
- IPC分类号: G01J5/00 ; F24C7/02 ; H05B6/68 ; H05B6/80
摘要:
An electronic oven equipped with an infrared detector element capable of detecting the temperature of food to be heated in a non-contact manner, in which a reflector converges the infrared rays from the heat in the oven cooking cavity onto the detector element, the reflector being pivotably mounted to cover a plate which has an inlet port to admit the converged rays from the reflector.
公开/授权文献
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