发明授权
- 专利标题: Apparatus for measuring the characteristics of an ultrasonic wave medium
- 专利标题(中): 用于测量超声波介质特性的装置
-
申请号: US574690申请日: 1984-01-27
-
公开(公告)号: US4534220A公开(公告)日: 1985-08-13
- 发明人: John R. Klepper , John M. Reid , Hirohide Miwa , Takaki Shimura , Keiichi Murakami
- 申请人: John R. Klepper , John M. Reid , Hirohide Miwa , Takaki Shimura , Keiichi Murakami
- 专利权人: Kleeper John R,Reid John M,Hirohide Miwa,Takaki Shimura,Keiichi Murakami
- 当前专利权人: Kleeper John R,Reid John M,Hirohide Miwa,Takaki Shimura,Keiichi Murakami
- 主分类号: A61B8/08
- IPC分类号: A61B8/08 ; A61B8/00 ; G01N27/90 ; G01N29/00 ; G01S15/02 ; G01S15/89
摘要:
The present invention relates to an apparatus which determines the distribution of the attenuation slope coefficient on a real time basis using the center frequency shift. The phase difference between a received signal and a reference signal is determined using EXCLUSIVE OR gates or an inverse trigonometric relation stored in a ROM. The phase difference is input to a differentiator which outputs the center frequency shift of the received signal on a real time basis. The center frequency shift is input to another differentiator which outputs the attenuation slope coefficient. Thus, the attenuation slope coefficient is determined using simple hardware and without calculating the power spectrum and the first moment.
公开/授权文献
- US5960300A Method of manufacturing semiconductor device 公开/授权日:1999-09-28
信息查询