发明授权
- 专利标题： Grazing incidence reflection spectrometer
- 专利标题（中）： 掠射入射反射光谱仪
-
申请号： US677245申请日： 1984-12-03
-
公开(公告)号： US4653908A公开(公告)日： 1987-03-31
- 发明人: Yusuke Yajima , Seiichi Murayama , Kanji Tsujii
- 申请人： Yusuke Yajima , Seiichi Murayama , Kanji Tsujii
- 申请人地址： JPX Tokyo
- 专利权人： Hitachi, Ltd.
- 当前专利权人： Hitachi, Ltd.
- 当前专利权人地址： JPX Tokyo
- 优先权： JPX58-226856 19831202
- 主分类号： G01N21/27
- IPC分类号： G01N21/27 ; G01J3/42 ; G01N21/00 ; G01N21/21 ; G01N21/33 ; G01J3/32
摘要：
The present invention consists in a grazing incidence reflection spectrometer wherein light is caused to incide on a surface of a sample, and an intensity of light reflected from the sample surface is detected, thereby to measure an electronic absorption spectrum of a material adsorbed to the sample surface, characterized in that the incident light is visible light or ultraviolet light, and that the incident light has a predetermined glancing angle to the sample surface.
公开/授权文献
- US5720987A Extrusion die with changeable face plate 公开/授权日：1998-02-24
信息查询
